Author Info
Name
Affiliation
Papers
LAUREN HOANG
Dept. of Electrical Eng., Stanford Univ., Stanford, CA, USA
1
Collaborators
Citations 
PageRank 
9
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties00.342022