Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Multi-Scan Architecture with Scan Chain Disabling Technique for Capture Power Reduction. | 0 | 0.34 | 2019 |
| Asymmetry dual-LFSR reseeding for low power BIST. | 0 | 0.34 | 2018 |
| Bipolar Dual-LFSR Reseeding for Low-Power Testing | 0 | 0.34 | 2018 |