Name
Abstract | ||
|---|---|---|
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/MDT.2007.176 | IEEE Design & Test of Computers |
Keywords | DocType | Volume |
tttc, test technology, iolts, ewdts, dft, ats,tttc,itc,dft,design,ewdts,tttc, test technology, mse 07, swtw 07, imstw 07,reliability, testing, and fault-tolerance,tttc, test technology, ets, ims3tw, iolts,miscellaneous,documentation,test technology,ets 2007,5th international board test workshop,tttc, test technology, ets, ims3tw, iolts, ndcs, dft, ats, wrtlt,ets,tttc, test technology, date, ddecs, vts, wtw, ets, sdd,ats,general,ims3tw,date,mtv 2006,wrtlt,ddecs 2007,mse 2007,delta,reliability,tttc, test technology, semiconductor wafer test workshop, swtw, itc, mtv, hldvt,ndcs,latw | Journal | 24 |
Issue | Citations | PageRank |
5 | 0 | 0.34 |
References | Authors | |
0 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bruce C. Kim | 1 | 89 | 21.11 |