| Physics-Based Low-Cost Test Technique for High Voltage LDMOS | 0 | 0.34 | 2013 |
| Modeling and characterization of CNT-based TSV for high frequency applications. | 0 | 0.34 | 2012 |
| Analysis Of Propagation Delay In 3-D Stacked Dram | 1 | 0.35 | 2012 |
| Radpro: Automatic Rf Analyzer And Diagnostic Program Generation Tool | 0 | 0.34 | 2010 |
| Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. | 0 | 0.34 | 2009 |
| TTTC Newsletter | 0 | 0.34 | 2008 |
| TTTC Newsletter | 0 | 0.34 | 2008 |
| TTTC Newsletter | 0 | 0.34 | 2008 |
| TTTC Newsletter | 0 | 0.34 | 2008 |
| TTTC Newsletter | 0 | 0.34 | 2008 |
| Guest Editors' Introduction: The Evolution of RFIC Design and Test | 0 | 0.34 | 2008 |
| Test Technology Newsletter. | 0 | 0.34 | 2007 |
| Test Technology TC Newsletter | 0 | 0.34 | 2007 |
| Low cost automatic mixed-signal board test using IEEE 1149.4 | 6 | 0.67 | 2007 |
| Test Technology Newsletter - October 2007 | 0 | 0.34 | 2007 |
| Test Technology TC Newsletter. | 0 | 0.34 | 2006 |
| Test Technology Technical Council Newsletter | 0 | 0.34 | 2006 |
| Test Technology TC Newsletter. | 0 | 0.34 | 2006 |
| DIBPro: Automatic Diagnostic Program Generation Tool | 3 | 0.60 | 2006 |
| Guest Editors' Introduction: Big Innovations in Small Packages | 1 | 0.35 | 2006 |
| A new low-cost RF built-in self-test measurement for system-on-chip transceivers | 15 | 1.17 | 2006 |
| A Novel RF Test Scheme Based on a DFT Method | 3 | 0.49 | 2006 |
| TTTC Newsletter | 0 | 0.34 | 2006 |
| Low-cost test technique using a new RF BIST circuit for 4.5–5.5GHz low noise amplifiers | 2 | 0.41 | 2005 |
| ADVANCED MEMS FOR HIGH POWER INTEGRATED DISTRIBUTION SYSTEMS | 0 | 0.34 | 2005 |
| Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit | 6 | 0.70 | 2005 |
| The Newsletter of Test Technology Council of the IEEE Computer Society | 0 | 0.34 | 2005 |
| A New BIST Scheme for 5GHz Low Noise Amplifiers | 3 | 0.53 | 2004 |
| Impact Of Parameter Imbalances On Transmit Diversity Ofdm System Performance | 0 | 0.34 | 2003 |
| MEMS spring probe for next generation wafer level testing | 3 | 0.49 | 2003 |
| An approach for selection of test points for analog fault diagnosis | 11 | 0.73 | 2003 |
| A Probe Scheduling Algorithm for MCM Substrates | 2 | 0.40 | 1999 |
| A Novel Test Methodology for MEMS Magnetic Micromotors | 1 | 0.36 | 1999 |
| A high throughput test methodology for MCM substrates | 0 | 0.34 | 1998 |
| A novel routing algorithm for MCM substrate verification using single-ended probe | 0 | 0.34 | 1998 |
| An Integrated Network Management System: The Design For Ain And B-Isdn | 0 | 0.34 | 1996 |
| DC built-in self-test for linear analog circuits | 19 | 3.70 | 1996 |
| A Novel Low-Cost Approach to MCM Interconnect Test | 13 | 1.71 | 1995 |
| A Methodology for Generation and Collection of Multiprocessor Traces | 0 | 0.34 | 1994 |
| Network Performance Monitoring And Fault Detection On The Gtnet. | 0 | 0.34 | 1992 |
