Name
Title | ||
|---|---|---|
Image Reconstruction Using Interval Simulated Annealing in Electrical Impedance Tomography. |
Abstract | ||
|---|---|---|
Electrical impedance tomography (EIT) is an imaging technique that attempts to reconstruct the impedance distribution inside an object from the impedance between electrodes placed on the object surface. The EIT reconstruction problem can be approached as a nonlinear nonconvex optimization problem in which one tries to maximize the matching between a simulated impedance problem and the observed dat... |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/TBME.2012.2188398 | IEEE Transactions on Biomedical Engineering |
Keywords | Field | DocType |
Conductivity,Impedance,Tomography,Finite element methods,Electrodes,Optimization,Electric potential | Simulated annealing,Iterative reconstruction,Computer vision,Nonlinear system,Computer science,Electrical impedance,Tomography,Electronic engineering,Artificial intelligence,Inverse problem,Optimization problem,Electrical impedance tomography | Journal |
Volume | Issue | ISSN |
59 | 7 | 0018-9294 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Thiago de Castro Martins | 1 | 18 | 6.73 |
| Erick Dario León Bueno de Camargo | 2 | 5 | 2.60 |
| Raul Gonzalez Lima | 3 | 39 | 8.39 |
| Marcelo Britto Passos Amato | 4 | 31 | 5.67 |
| Marcos de Sales Guerra Tsuzuki | 5 | 5 | 2.14 |