Name
Title | ||
|---|---|---|
Experimental Results of Forward-Looking Reverse Order Fault Simulation on Industrial Circuits with Scan |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/ATS.2001.990334 | Asian Test Symposium |
Keywords | Field | DocType |
experimental results,order fault simulation,industrial circuits,computer simulation,fault detection,graphics,computational modeling | Stuck-at fault,Automatic test pattern generation,Fault coverage,Computer science,Software fault tolerance,Electronic engineering,Real-time computing,Fault (power engineering),Electronic circuit,Fault model,Fault indicator | Conference |
Citations | PageRank | References |
1 | 0.62 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Irith Pomeranz | 1 | 3829 | 336.84 |
| Sudhakar M. Reddy | 2 | 5747 | 699.51 |
| Xijiang Lin | 3 | 687 | 42.03 |