Title
Delay Hazards in Complex Gate Based Speed Independent VLSI Circuits
Abstract
Although speed independent VLSI circuit design is supported by rich theory at higher levels, it suffers from the lack of an area efficient robust transistor level implementation technique. In this paper we introduce safe cells based on which well-formed STGs can be implemented free of (delay) hazards with no unrealistic assumptions about physical gates. Although this technique still compromises chip area for the sake of preventing hazards, we show that it may achieve a significant area gain in comparison with the two-phase RS-implementation method, which is one of the few true speed independent implementation techniques that we are aware of so far. Delay hazards are then analysed in complex gate based speed independent circuits and hence theorems are developed to identify a subclass of delay hazards.
Year
DOI
Venue
1996
10.1109/GLSV.1996.497631
Great Lakes Symposium on VLSI
Keywords
Field
DocType
VLSI,asynchronous circuits,delays,hazards and race conditions,integrated circuit interconnections,logic design,signal flow graphs,STGs,area efficient robust transistor level implementation,area gain,asynchronous circuits,chip area,delay hazards,gate based speed independent VLSI circuits,signal transition graphs,speed independent implementation techniques
Logic synthesis,Computer science,Electronic engineering,Real-time computing,Design methods,Robustness (computer science),Chip,Network analysis,Transistor,Electronic circuit,Very-large-scale integration
Conference
ISSN
ISBN
Citations 
1066-1395
0-8186-7502-0
1
PageRank 
References 
Authors
0.36
0
3
Name
Order
Citations
PageRank
Nozar Tabrizi1294.11
Michael J. Liebelt25613.27
Kamran Eshraghian310127.54