Name
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TEST.2005.1583980 | ITC |
Keywords | Field | DocType |
automatic test equipment,jitter,automatic test equipment,frequency-shifting,jitter measurement,wideband DeltaPhi method | Wideband,Automatic test equipment,Computer science,Electronic engineering,Low noise,Real-time computing,Jitter | Conference |
Citations | PageRank | References |
6 | 0.65 | 8 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Takahiro J. Yamaguchi | 1 | 176 | 35.24 |
| Masahiro Ishida | 2 | 105 | 22.58 |
| Mani Soma | 3 | 497 | 73.41 |