| Statistical computational methods for mixed-signal performance metrics under process variations and noise models | 0 | 0.34 | 2016 |
| A new method for measuring alias-free aperture jitter in an ADC output | 0 | 0.34 | 2015 |
| On-line detection of intermittent faults in digital-to-analog converters | 1 | 0.39 | 2015 |
| Special session 8C: Hot topic: Designers' and test researchers' roles in analog design-for-test. | 0 | 0.34 | 2014 |
| A method for phase noise extraction from data communication | 0 | 0.34 | 2014 |
| On the usage of resonate and fire dynamics in the complex oscillation-based test approach. | 0 | 0.34 | 2013 |
| A digital method for phase noise measurement | 9 | 0.78 | 2012 |
| An Equivalent-Time And Clocked Approach For Continuous-Time Quantization | 2 | 0.48 | 2011 |
| Application of a continuous-time level crossing quantization method for timing noise measurements | 0 | 0.34 | 2011 |
| Resonate and fire dynamics in Complex Oscillation Based Test of analog filters. | 0 | 0.34 | 2011 |
| Complex Oscillation Based Test Of Analog Filters | 3 | 0.43 | 2009 |
| A Time Domain Method to Measure Oscillator Phase Noise | 2 | 0.47 | 2009 |
| A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. | 7 | 0.67 | 2008 |
| Enhancing industry participation in ISCAS and Circuits and Systems Society | 0 | 0.34 | 2008 |
| An On-Chip Delta-Time-to-Voltage Converter for Real-Time Measurement of Clock Jitter | 2 | 0.51 | 2007 |
| Data jitter measurement using a delta-time-to-voltage converter method. | 1 | 0.39 | 2007 |
| Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter | 0 | 0.34 | 2007 |
| RF Front-end System Gain and Linearity Built-in Test | 17 | 1.27 | 2006 |
| A Study Of Per-Pin Timing Jitter Scope | 3 | 0.57 | 2006 |
| A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement | 3 | 0.50 | 2006 |
| Method to measure RF transceiver bandwidth in the time domain | 4 | 0.49 | 2006 |
| A wideband low-noise ATE-based method for measuring jitter in GHz signals. | 6 | 0.65 | 2005 |
| Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement | 8 | 0.79 | 2005 |
| Guaranteed by design or guaranteed to fail or guaranteed by test? or ... neither? | 0 | 0.34 | 2005 |
| Experimental Results for High-Speed Jitter Measurement Technique | 7 | 0.81 | 2004 |
| A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems | 4 | 0.51 | 2004 |
| On-Chip Calibration Technique For Delay Line Based Bist Jitter Measurement | 4 | 0.60 | 2004 |
| GHz RF front-end bandwidth time domain measurement | 2 | 0.55 | 2004 |
| Measurement of Phase and Frequency Variations in Radio-Frequency Signals | 2 | 0.43 | 2003 |
| Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division | 3 | 0.51 | 2003 |
| Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division | 10 | 1.06 | 2002 |
| A new method for testing jitter tolerance of SerDes devices using sinusoidal jitter | 12 | 1.90 | 2002 |
| A wavelet-based timing parameter extraction method | 0 | 0.34 | 2002 |
| Test evaluation and data on defect-oriented BIST architecture for high-speed PLL | 5 | 0.55 | 2001 |
| Hierarchical ATPG for Analog Circuits and Systems | 17 | 1.67 | 2001 |
| Testing clock distribution circuits using an analytic signal method | 5 | 1.85 | 2001 |
| Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? | 0 | 0.34 | 2001 |
| A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency Clock Signals | 36 | 5.61 | 2001 |
| An effective defect-oriented BIST architecture for high-speed phase-locked loops | 15 | 1.61 | 2000 |
| Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method | 21 | 6.20 | 2000 |
| Self-checking scheme for very fast clocks' skew correction | 4 | 0.49 | 1999 |
| Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems | 4 | 0.59 | 1999 |
| Test set selection for structural faults in analog IC's | 14 | 1.21 | 1999 |
| A Test Point Insertion Algorithm for Mixed-Signal Circuits | 6 | 0.65 | 1999 |
| Panel Statement: Increasing Test Coverage in a VLSI Design Course | 0 | 0.34 | 1999 |
| Dynamic Test Set Generation for Analog Circuits and Systems | 1 | 0.42 | 1998 |
| Mixed-signal on-chip timing measurements | 4 | 0.64 | 1998 |
| Testability analysis and multi-frequency ATPG for analog circuits and systems | 8 | 0.81 | 1998 |
| Dynamic testing of ADCs using wavelet transforms | 9 | 1.35 | 1997 |
| Experimental Results for Current-Based Analog Scan. | 0 | 0.34 | 1997 |
