Title
ScTMR: A scan chain-based error recovery technique for TMR systems in safety-critical applications.
Abstract
We propose a roll-forward error recovery technique based on multiple scan chains for TMR systems, called Scan chained TMR (ScTMR). ScTMR reuses the scan chain flip-flops employed for testability purposes to restore the correct state of a TMR system in the presence of transient or permanent errors. In the proposed ScTMR technique, we present a voter circuitry to locate the faulty module and a controller circuitry to restore the system to the fault-free state. As a case study, we have implemented the proposed ScTMR technique on an embedded processor, suited for safety-critical applications. Exhaustive fault injection experiments reveal that the proposed architecture has the error detection and recovery coverage of 100% with respect to Single Event Upset (SEU) while imposing a negligible area and performance overhead as compared to traditional TMR-based techniques.
Year
DOI
Venue
2011
10.1109/DATE.2011.5763277
DATE
Keywords
Field
DocType
fault tolerant computing,microprocessor chips,safety-critical software,system recovery,ScTMR,TMR systems,controller circuitry,exhaustive fault injection experiments,roll forward error recovery technique,safety critical applications,scan chain based error recovery technique,scan chain flip flops,single event upset,voter circuitry
Testability,Control theory,Central processing unit,Computer science,Scan chain,Real-time computing,Error detection and correction,Fault tolerance,Single event upset,Fault injection,Embedded system
Conference
ISSN
Citations 
PageRank 
1530-1591
6
0.60
References 
Authors
6
3
Name
Order
Citations
PageRank
Mojtaba Ebrahimi133624.74
Seyed Ghassem Miremadi253150.32
Hossein Asadi332331.94