Name
Title | ||
|---|---|---|
Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1016/S0026-2714(01)00192-5 | Microelectronics Reliability |
Keywords | Field | DocType |
shallow trench isolation | Geotechnical engineering,Electronic engineering,Engineering,Shallow trench isolation | Journal |
Volume | Issue | ISSN |
41 | 9 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Young Pil Kim | 1 | 0 | 0.68 |
| Beom Jun Jin | 2 | 0 | 0.34 |
| Young Wook Park | 3 | 0 | 0.34 |
| Joo Tae Moon | 4 | 0 | 0.68 |
| Sang U. Kim | 5 | 0 | 0.68 |