Title
Experimental Results for Slow-speed Timing Characterization of High-speed Pipelined Datapaths
Abstract
This article presents experimental results for a clock-timing methodology that allows timing characterization and testing of high-speed pipelined datapaths using slow-speed testers. The technique uses a clock-timing circuit to control the data flow in the pipeline in the test mode. Test results show that the design provides an average timing resolution of 52.9 ps in 0.18 μm CMOS technology. Results also demonstrate the ability of the technique to track the performance of high-speed pipelines at a reduced clock frequency and to test the clock-timing circuit used to generate and control test mode clocks.
Year
DOI
Venue
2011
10.1007/s10836-010-5186-3
J. Electronic Testing
Keywords
Field
DocType
Timing characterization,Circuit testing,Delay circuits,Design-for-testability,High-speed pipelined datapaths
Design for testing,Pipeline transport,Computer science,Electronic engineering,CMOS,Real-time computing,Clock rate,Data flow diagram
Journal
Volume
Issue
ISSN
27
1
0923-8174
Citations 
PageRank 
References 
0
0.34
10
Authors
2
Name
Order
Citations
PageRank
Muhammad Nummer174.53
Manoj Sachdev266988.45