Paper Info
Title
Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares
Abstract
Reliability calculations from failure time data are often performed using least squares regression of the log of the mean time to failure (MTTF) vs. inverse temperature. It is demonstrated that this method produces estimates of relevant parameters like E a and MTTF with confidence limits that are larger and more variable than necessary. In comparison, the method of maximum likelihood makes more efficient use of the data and as a result, does not suffer from the above difficulties. A previously published dataset is used to compare the two techniques and the maximum likelihood approach is shown to be superior.
Year
DOI
Venue
2003
10.1016/S0026-2714(03)00071-4
Microelectronics Reliability
Keywords
DocType
Volume
least square,confidence limit,maximum likelihood,accelerated life testing,mean time to failure
Journal
43
Issue
ISSN
Citations 
6
Microelectronics Reliability
2
PageRank 
References 
Authors
0.66
0
1
Name
Order
Citations
PageRank
Charles S. Whitman185.83