Name
Abstract | ||
|---|---|---|
A novel approach is presented for digital generation of an analog waveform suitable for BIST of high-resolution analog-to-digital converters (ADCs). The staircase-like exponential waveform is shown to have properties of a perfectly linear ramp when used as the stimulus for a 3rd order polynomial fitting algorithm that measures offset, gain, 2nd and 3rd harmonic distortion. The technique is particularly suitable for testing high resolution (12 bits) sigma-delta ADCs in a noisy environment, which can then be used to test digital-to-analog converters (DACs). Experimental results for a 44 kHz 16-bit ADC show that the technique measures distortion with better than 0.01% accuracy in the presence of random and 50 or 60 Hz noise. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/TEST.2002.1041859 | ITC |
Keywords | Field | DocType |
analogue-digital conversion,built-in self test,harmonic distortion,integrated circuit testing,16 bit,44 kHz,50 Hz,60 Hz,A/D converter,BIST,distortion,harmonic distortion,high accuracy stimulus generation,sigma-delta ADCs,staircase-like exponential waveform,third order polynomial fitting algorithm | SINADR,Total harmonic distortion,Polynomial,Computer science,Waveform,Electronic engineering,Converters,Successive approximation ADC,Distortion,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7543-2 | 19 |
PageRank | References | Authors |
1.81 | 5 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Aubin Roy | 1 | 172 | 22.92 |
| Stephen Sunter | 2 | 50 | 5.39 |
| Alessandra Fudoli | 3 | 19 | 1.81 |
| Davide Appello | 4 | 37 | 8.48 |