| Applicative System Level Test introduction to Increase Confidence on Screening Quality | 0 | 0.34 | 2020 |
| Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. | 0 | 0.34 | 2018 |
| An Optimized Test During Burn-In for Automotive SoC. | 1 | 0.39 | 2018 |
| An Evolutionary Algorithm Approach To Stress Program Generation During Burn-In | 0 | 0.34 | 2018 |
| A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. | 1 | 0.41 | 2017 |
| A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor | 0 | 0.34 | 2017 |
| Current testing: Dead or alive? | 0 | 0.34 | 2013 |
| Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? | 0 | 0.34 | 2013 |
| Optimized embedded memory diagnosis | 1 | 0.43 | 2011 |
| Safety features of SoCs: How can they be re-used? | 0 | 0.34 | 2010 |
| Evaluating Alpha-Induced Soft Errors In Embedded Microprocessors | 0 | 0.34 | 2009 |
| An I-Ip Based Approach For The Monitoring Of Nbti Effects In Socs | 0 | 0.34 | 2009 |
| An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains | 1 | 0.35 | 2007 |
| System-in-Package Testing: Problems and Solutions | 10 | 1.14 | 2006 |
| Technical Program Committee | 0 | 0.34 | 2004 |
| A practical evaluation of IDDQ test strategies for deep submicron production test application. Experiences and targets from the field | 4 | 0.56 | 2003 |
| High Accuracy Stimulus Generation for A/D Converter BIST | 19 | 1.81 | 2002 |
