Title
Influence of nitrogen on carrier localization in InGaAsN/GaAs single quantum wells
Abstract
We have investigated a set of In0.41Ga0.59As1−yNy/GaAs SQW structures grown by solid source MBE with nitrogen concentrations up to 5.2%. To study the localization of carriers we performed PL measurements at the temperature range between 10 and 290 K. We found that the only at low temperatures the carriers are localised and the localisation energy changes from 0 to 12meV, depending on N content. At low temperatures we can observe S-shaped energy peak behaviour for structures with high nitrogen content. Detailed investigations of the optical properties of QW system, was possible due to the room temperature photoreflectance measurements.
Year
DOI
Venue
2003
10.1016/S0026-2692(03)00115-0
Microelectronics Journal
Keywords
Field
DocType
III-V-Nitrides,Quantum well,Carrier localization
Nitrogen,Atmospheric temperature range,Engineering,Optoelectronics,Quantum well,Condensed matter physics
Journal
Volume
Issue
ISSN
34
5
0026-2692
Citations 
PageRank 
References 
0
0.34
0
Authors
7
Name
Order
Citations
PageRank
J. Misiewicz112.85
P. Sitarek200.34
K. Ryczko310.82
R. Kudrawiec412.85
M. Fischer500.34
M. Reinhardt600.34
A. Forchel711.16