Name
Year | DOI | Venue |
|---|---|---|
1990 | 10.1109/TEST.1990.114087 | ITC |
Keywords | Field | DocType |
CMOS integrated circuits,VLSI,automatic testing,data acquisition,failure analysis,fault location,integrated circuit testing,CMOS VLSI,VLSI,chip failures,cumulative fault coverage,data collection,fault coverage,fault simulator,reject ratio prediction,wafer probe test | Data collection,Fault coverage,Computer science,Data acquisition,CMOS,Electronic engineering,Chip,Wafer testing,Fault Simulator,Very-large-scale integration | Conference |
Citations | PageRank | References |
35 | 8.37 | 2 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| dharam vir das | 1 | 35 | 8.37 |
| Sharad C. Seth | 2 | 671 | 93.61 |
| paul wagner | 3 | 35 | 8.37 |
| john c anderson | 4 | 35 | 8.37 |
| Vishwani D. Agrawal | 5 | 3502 | 470.06 |