Title
A 32 kb 10T Sub-Threshold SRAM Array With Bit-Interleaving and Differential Read Scheme in 90 nm CMOS
Abstract
Ultra-low voltage operation of memory cells has become a topic of much interest due to its applications in very low energy computing and communications. However, due to parameter variations in scaled technologies, stable operation of SRAMs is critical for the success of low-voltage SRAMs. It has been shown that conventional 6T SRAMs fail to achieve reliable subthreshold operation. Hence, researche...
Year
DOI
Venue
2009
10.1109/JSSC.2008.2011972
IEEE Journal of Solid-State Circuits
Keywords
Field
DocType
Random access memory,Stability,CMOS technology,Low voltage,Error correction codes,Hardware,Power supplies,Noise reduction,Semiconductor device noise,Power measurement
Logic gate,Soft error,Leakage (electronics),Computer science,Electronic engineering,CMOS,Static random-access memory,Subthreshold conduction,Electrical engineering,Integrated circuit,Low-power electronics
Journal
Volume
Issue
ISSN
44
2
0018-9200
Citations 
PageRank 
References 
27
2.10
5
Authors
4
Name
Order
Citations
PageRank
Ik Joon Chang119925.32
Jae-Joon Kim227537.46
Sang Phill Park353531.56
Kaushik Roy4272.10