Sang Phill Park - Citegraph

Author Info

Name	Affiliation	Papers
SANG PHILL PARK	Purdue University, West Lafayette, IN	20
Collaborators	Citations	PageRank
33	535	31.56
Referers	Referees	References
1285	313	151

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Publications (20 rows)

Collaborators (33 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
System-Level Power Analysis of a Multicore Multipower Domain Processor With ON-Chip Voltage Regulators.	2	0.39	2016
Write-optimized reliable design of STT MRAM	32	1.46	2012
Layout-aware optimization of STT MRAMs	20	1.54	2012
Future cache design using STT MRAMs for improved energy efficiency: Devices, circuits and architecture	37	1.68	2012
Poly-Si Thin Film Transistors: Opportunities for low-cost RF applications	0	0.34	2012
Low-Overhead Maximum Power Point Tracking for Micro-Scale Solar Energy Harvesting Systems	13	0.89	2012
Soft-Error-Resilient FPGAs Using Built-In 2-D Hamming Product Code	15	1.00	2012
IMPACT: imprecise adders for low-power approximate computing	147	6.22	2011
Column-selection-enabled 8T SRAM array with ~1R/1W multi-port operation for DVFS-enabled processors	8	1.00	2011
Stage number optimization for switched capacitor power converters in micro-scale energy harvesting	5	0.59	2011
Memory-based embedded digital ATE	1	0.37	2011
On-Chip Variability Sensor Using Phase-Locked Loop for Detecting and Correcting Parametric Timing Failures	33	1.53	2010
Exploring Asynchronous Design Techniques for Process-Tolerant and Energy-Efficient Subthreshold Operation	30	1.86	2010
Efficient power conversion for ultra low voltage micro scale energy transducers	7	0.70	2010
Analysis and design of ultra low power thermoelectric energy harvesting systems	11	1.02	2010
Reliability Implications of Bias-Temperature Instability in Digital ICs	34	1.70	2009
A 32 kb 10T Sub-Threshold SRAM Array With Bit-Interleaving and Differential Read Scheme in 90 nm CMOS	27	2.10	2009
Process variation tolerant SRAM array for ultra low voltage applications	25	1.91	2008
NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution?	45	2.32	2008
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance	43	2.93	2007