Title
A Hierarchical Architecture for Concurrent Soft Error Detection Based on Current Sensing
Abstract
Robust circuit design techniques with respect to soft errors gain importance in the era of very deep submicron technologies. On-line testing will play an important role towards this direction. In this paper we propose a hierarchical architecture for concurrent soft error detection. This architecture is based on current sensing techniques and provides very low area overhead, small detection times and negligible performance penalty on the funtional circuit under check.
Year
DOI
Venue
2002
10.1109/OLT.2002.1030184
IOLTW
Keywords
Field
DocType
CMOS memory circuits,SPICE,SRAM chips,built-in self test,current comparators,current mirrors,error detection,fault diagnosis,fault tolerant computing,integrated circuit testing,radiation hardening (electronics),CMOS technology,SPICE simulation,combinational circuit,concurrent soft error detection,current mirrors,current sensing,hierarchical architecture,low area overhead,on-line testing,retry cycle,robust circuit design,sensing comparator,single event upsets,small detection times,soft error tolerance,time redundancy,transient faults
Architecture,Current mirror,Spice,Computer science,Circuit design,Real-time computing,Electronic engineering,Error detection and correction,Soft error detection,Built-in self-test
Conference
ISBN
Citations 
PageRank 
0-7695-1641-6
8
1.36
References 
Authors
0
4
Name
Order
Citations
PageRank
Y. Tsiatouhas16811.07
A. Arapoyanni23911.46
D. Nikolos329131.38
Th. Haniotakis4437.74