Name
Abstract | ||
|---|---|---|
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). The results show that all of the shorts and the opens are detected by supply current testing, while opens of the MOS switches are not detected. A DFT method for resistor string DACs is proposed in this paper to detect the opens by supply current testing. Also, testability of a resistor string DAC designed with the DFT method is examined. It is shown that all of the targeted shorts and opens in the testable designed DAC are detected by supply current testing. |
Year | Venue | Keywords |
|---|---|---|
2006 | ATS '07 Proceedings of the 16th Asian Test Symposium | network synthesis |
Field | DocType | ISBN |
Testability,Design for testing,Computer science,Electronic engineering,Converters,Resistor,Integrated circuit design,Mixed-signal integrated circuit,Electrical engineering,Supply current | Conference | 0-7695-2890-2 |
Citations | PageRank | References |
1 | 0.38 | 3 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masaki Hashizume | 1 | 98 | 27.83 |
| Tomomi Nishida | 2 | 1 | 0.38 |
| Hiroyuki Yotsuyanagi | 3 | 70 | 19.04 |
| Takeomi Tamesada | 4 | 45 | 12.49 |
| Yukiya Miura | 5 | 83 | 15.06 |