Name
Title | ||
|---|---|---|
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. |
Abstract | ||
|---|---|---|
•A new research activity which mixes EMC and IC reliability.•We study the effect of IC aging its electromagnetic behavior.•Experimental methodology to qualify IC EMC drifts after aging.•Link between on-chip degradation mechanisms and EMC drifts.•Methodology to predict long-term electromagnetic robustness. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.microrel.2013.08.016 | Microelectronics Reliability |
Field | DocType | Volume |
Predictive methods,Systems engineering,Robustness (computer science),Electronic systems,Engineering,Integrated circuit,Reliability engineering | Journal | 53 |
Issue | ISSN | Citations |
9 | 0026-2714 | 1 |
PageRank | References | Authors |
0.35 | 2 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sonia Ben Dhia | 1 | 6 | 2.04 |
| Alexandre Boyer | 2 | 19 | 6.90 |