Alexandre Boyer - Citegraph

Author Info

Name	Affiliation	Papers
ALEXANDRE BOYER	LAAS-CNRSUniversité de ToulouseToulouseFrance	16
Collaborators	Citations	PageRank
32	19	6.90
Referers	Referees	References
69	66	26

Publications (16 rows)

Collaborators (32 rows)

Referers (69 rows)

Referees (66 rows)

Title	Citations	PageRank	Year
Detecting PCB Assembly Defects Using Infrared Thermal Signatures	0	0.34	2019
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs	1	0.63	2018
New defect detection approach using near electromagnetic field probing of high density PCBAs.	0	0.34	2018
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter	1	0.37	2015
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint	1	0.37	2015
A methodologic project to characterize and model COTS component reliability	0	0.34	2015
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.	0	0.34	2014
Effect Of Aging On Power Integrity And Conducted Emission Of Digital Integrated Circuits	1	0.43	2014
Effect of aging on power integrity of digital integrated circuits.	2	0.51	2013
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project.	1	0.35	2013
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.	0	0.34	2013
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations.	7	0.80	2012
Integrated Circuit Emission Model Extraction with a Fuzzy Logic System	1	0.43	2011
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.	0	0.34	2011
A New Approach To Modeling The Impact Of Emi On Mosfet Dc Behavior	1	0.38	2011
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits	3	0.59	2008

1