Name
Abstract | ||
|---|---|---|
The paper introduces a new algorithm for the automatedsynthesis of phase shifters - circuits used to remove effectsof structural dependencies featured by two-dimensionaltest generators. The algorithms presented in the papersynthesize in a time-efficient manner very large and fastphase shifters for built-in self-test environment, with guaranteedminimal phaseshifts between scan chains, and verylow delay and area of virtually one 2-way XOR gate perchannel. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/TEST.1998.743303 | ITC |
Keywords | Field | DocType |
large phase shifters,fastphase shifters,phase shifters,automated synthesis,verylow delay,guaranteedminimal phaseshifts,two-dimensionaltest generator,2-way xor gate perchannel,new algorithm,time-efficient manner,effectsof structural dependency,built-in self-test environment,phase shifter,graphics,phase shift,linear feedback shift register,automatic test pattern generation,shift registers,hardware,logic synthesis | Automatic test pattern generation,Shift register,Logic testing,Computer science,XOR gate,Communication channel,Electronic engineering,Real-time computing,Phase shift module,Low delay,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-5093-6 | 30 |
PageRank | References | Authors |
5.01 | 6 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Janusz Rajski | 1 | 2460 | 201.28 |
| Nagesh Tamarapalli | 2 | 772 | 58.83 |
| Jerzy Tyszer | 3 | 838 | 74.98 |