| LBIST for Automotive ICs With Enhanced Test Generation | 0 | 0.34 | 2022 |
| X-Masking for In-System Deterministic Test | 0 | 0.34 | 2022 |
| X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan | 0 | 0.34 | 2021 |
| Autonomous Scan Patterns for Laser Voltage Imaging | 0 | 0.34 | 2021 |
| On Reduction of Deterministic Test Pattern Sets | 1 | 0.38 | 2021 |
| Time and Area Optimized Testing of Automotive ICs | 0 | 0.34 | 2021 |
| Convolutional Compaction-Based MRAM Fault Diagnosis | 0 | 0.34 | 2021 |
| X-Tolerant Tunable Compactor for In-System Test | 1 | 0.35 | 2020 |
| Scan Integrity Tests for EDT Compression | 0 | 0.34 | 2020 |
| Low Cost Hypercompression of Test Data | 1 | 0.35 | 2020 |
| Test Sequence-Optimized BIST for Automotive Applications | 1 | 0.35 | 2020 |
| Deterministic Stellar BIST for Automotive ICs | 1 | 0.35 | 2020 |
| Test Time and Area Optimized BrST Scheme for Automotive ICs | 0 | 0.34 | 2019 |
| Logic BIST with Capture-per-Clock Hybrid Test Points | 3 | 0.39 | 2019 |
| On Cyclic Scan Integrity Tests for EDT-based Compression | 0 | 0.34 | 2019 |
| Deterministic Stellar BIST for In-System Automotive Test | 0 | 0.34 | 2018 |
| Hypercompression of Test Patterns | 0 | 0.34 | 2018 |
| On New Class of Test Points and Their Applications | 0 | 0.34 | 2018 |
| Hardware Protection via Logic Locking Test Points. | 0 | 0.34 | 2018 |
| ROM fault diagnosis for O(n2) test algorithms. | 0 | 0.34 | 2017 |
| Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns. | 2 | 0.36 | 2017 |
| Trimodal Scan-Based Test Paradigm. | 7 | 0.52 | 2017 |
| Embedded Deterministic Test Points. | 6 | 0.45 | 2017 |
| On Test Points Enhancing Hardware Security | 0 | 0.34 | 2016 |
| On New Test Points for Compact Cell-Aware Tests. | 1 | 0.35 | 2016 |
| A deterministic BIST scheme based on EDT-compressed test patterns | 0 | 0.34 | 2015 |
| Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures | 2 | 0.64 | 2015 |
| Isometric Test Data Compression | 4 | 0.42 | 2015 |
| Low-Power Programmable PRPG With Test Compression Capabilities | 8 | 0.51 | 2015 |
| Design for low test pattern counts | 2 | 0.37 | 2015 |
| Embedded deterministic test points for compact cell-aware tests | 7 | 0.52 | 2015 |
| TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm. | 1 | 0.35 | 2015 |
| Low Power Test Compression with Programmable Broadcast-Based Control | 0 | 0.34 | 2014 |
| Erratum to "Test Time Reduction in EDT Bandwidth Management for SoC Designs". | 0 | 0.34 | 2014 |
| Quality assurance in memory built-in self-test tools | 1 | 0.37 | 2014 |
| On Using Implied Values in EDT-based Test Compression | 1 | 0.35 | 2014 |
| On Deploying Scan Chains for Data Storage in Test Compression Environment. | 4 | 0.41 | 2013 |
| Fault diagnosis of TSV-based interconnects in 3-D stacked designs | 6 | 0.50 | 2013 |
| Test Time Reduction in EDT Bandwidth Management for SoC Designs | 1 | 0.37 | 2013 |
| EDT bandwidth management - Practical scenarios for large SoC designs | 8 | 0.58 | 2013 |
| EDT Bandwidth Management in SoC Designs | 13 | 0.59 | 2012 |
| Bandwidth-aware test compression logic for SoC designs | 8 | 0.49 | 2012 |
| Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs | 5 | 0.55 | 2011 |
| EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism | 7 | 0.45 | 2011 |
| Ring Generator: An Ultimate Linear Feedback Shift Register | 0 | 0.34 | 2011 |
| Power Aware Embedded Test | 4 | 0.45 | 2011 |
| Diagnosis of failing scan cells through orthogonal response compaction | 2 | 0.37 | 2011 |
| Dynamic Channel Allocation For Higher Edt Compression In Soc Designs | 7 | 0.51 | 2010 |
| On compaction utilizing inter and intra-correlation of unknown states | 15 | 0.61 | 2010 |
| Low Power Compression Of Incompatible Test Cubes | 2 | 0.36 | 2010 |
