Paper Info
Title
LT-RTPG: A New Test-Per-Scan BIST TPG for Low Heat Dissipation
Abstract
A new BIST TPG design, called low-transition random TPG (LT-RTPG), that is comprised of an LFSR,a k-input AND gate, and a T flip-flop, is presented.When used to generate test patterns for test-per-scanBIST, it decreases the number of transitions that occur during scan shifting and hence decreases the heatdissipated during testing. Various properties of LT-RTPG's are studied and a methodology for their designis presented. Experimental results demonstrate thatLT-RTPG's designed using the proposed methodologydecrease the heat dissipated during BIST by significantamounts while attaining high fault coverage, especiallyfor circuits with moderate to large number of scan inputs.
Year
DOI
Venue
1999
10.1109/TEST.1999.805617
ITC
Keywords
Field
DocType
various property,new bist tpg design,proposed methodologydecrease,low-transition random tpg,high fault coverage,especiallyfor circuit,new test-per-scan bist tpg,large number,low heat dissipation,test pattern,inductance,shift registers,fault coverage,automatic test pattern generation,temperature,design for testability,lfsr
Design for testing,Automatic test pattern generation,Shift register,Inductance,Fault coverage,Computer science,Electronic engineering,Real-time computing,Electronic circuit,AND gate,Built-in self-test
Conference
ISBN
Citations 
PageRank 
0-7803-5753-1
42
4.61
References 
Authors
7
2
Name
Order
Citations
PageRank
Seongmoon Wang160548.50
Sandeep K. Gupta21980229.01