Name
Year | DOI | Venue |
|---|---|---|
1992 | 10.1109/TEST.1992.527865 | ITC |
Keywords | Field | DocType |
gigahertz test system,calibration techniques,multiplexing,calibration,circuits,system testing,frequency,signal generators,gallium arsenide | Gallium arsenide,Digital signal,Computer science,System testing,Signal generator,Timing error,Electronic engineering,Real-time computing,Electronic circuit,Multiplexing,Electrical engineering,Calibration | Conference |
ISBN | Citations | PageRank |
0-7803-0760-7 | 4 | 0.85 |
References | Authors | |
0 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |
| R. J. Wenzel | 2 | 10 | 1.84 |