| Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. | 0 | 0.34 | 2019 |
| A Framework for Design of Self-Repairing Digital Systems | 0 | 0.34 | 2019 |
| A chip-level security framework for assessing sensor data integrity: work-in-progress | 0 | 0.34 | 2018 |
| Securing Medical Devices Against Hardware Trojan Attacks Through Analog-, Digital-, and Physiological-Based Signatures. | 0 | 0.34 | 2018 |
| Use of Analog Signatures for Hardware Trojan Detection. | 0 | 0.34 | 2017 |
| Biologically inspired hierarchical structure for self-repairing FPGAs | 2 | 0.41 | 2017 |
| An Ultra-High-Speed Test Module and FPGA-Based Development Platform | 0 | 0.34 | 2016 |
| A Novel Approach to Detect Hardware Trojan Attacks on Primary Data Inputs | 2 | 0.41 | 2015 |
| An FPGA-based ATE extension module for low-cost multi-GHz memory test | 2 | 0.36 | 2015 |
| A signature based architecture for Trojan detection | 4 | 0.46 | 2014 |
| Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms | 1 | 0.38 | 2014 |
| Minimizing Simultaneous Switching Noise At Reduced Power With Constant-Voltage Power Transmission Lines For High-Speed Signaling | 2 | 0.67 | 2013 |
| Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus | 0 | 0.34 | 2013 |
| Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter | 1 | 0.38 | 2012 |
| Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing. | 0 | 0.34 | 2012 |
| Multi-Function Multi-Ghz Ate Extension Using State-Of-The-Art Fpgas | 1 | 0.38 | 2011 |
| Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels | 0 | 0.34 | 2011 |
| Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic | 2 | 0.44 | 2010 |
| A Development Platform And Electronic Modules For Automated Test Up To 20 Gbps | 5 | 0.62 | 2009 |
| Variable delay of multi-gigahertz digital signals for deskew and jitter-injection test applications | 3 | 0.70 | 2008 |
| An Electronic Module For 12.8 Gbps Multiplexing And Loopback Test | 5 | 0.71 | 2008 |
| Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses | 7 | 0.87 | 2006 |
| Multiplexing ATE Channels for Production Testing at 2.5 Gbps | 6 | 0.96 | 2004 |
| Alternative interface methods for testing high speed bidirectional signals | 5 | 0.65 | 1998 |
| Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test | 6 | 0.99 | 1997 |
| Smac - A Scene Matching Chip | 0 | 0.34 | 1993 |
| Known Godd Die for MCMs: Enabling Technologies | 0 | 0.34 | 1993 |
| Calibration Techniques for a Gigahertz Test System | 4 | 0.85 | 1992 |
| MCM Test Using Available Technology | 0 | 0.34 | 1992 |
| Real-Time Data Comparison for GigaHertz Digital Test | 8 | 1.98 | 1991 |
| High Frequency Wafer Probing and Power Supply Resonance Effects | 0 | 0.34 | 1991 |
| Tester Independent Support Software System (TISSS) | 2 | 0.40 | 1985 |
