Paper Info
Title
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus
Abstract
In the recent past, there has been steady growth in the data transfer rate of modern digital serial communication systems. Consequently, accurate characterization of high-speed signal transmission lines is necessary for ensuring high signal integrity. Time domain reflectometry (TDR) has been widely used in prior research to characterize high speed interconnect. The accuracy of the characterization depends on the sampling rate and the slew rate of the TDR input excitation signal. At high speeds it is not always possible to deliver "perfect" (impulse/step) TDR stimulus. In this paper, an algorithm is presented to compensate for the inherent distortion in nonideal TDR stimulus to improve the accuracy of interconnect characterization. The algorithm is applied to the problem of micro strip transmission line characterization for identifying discontinuities in signal interconnect. Hardware measurements validate the effectiveness of the proposed technique.
Year
DOI
Venue
2013
10.1109/ATS.2013.58
Asian Test Symposium
Keywords
Field
DocType
accurate characterization,enhanced resolution time-domain reflectometry,high signal integrity,tdr input excitation signal,tdr stimulus,high speed channels,slew rate,high speed,data transfer rate,sampling rate,high-speed signal transmission line,characterizing spatial discontinuities,nonideal tdr stimulus,non-ideal stimulus,transmission line theory,time domain reflectometry
Time domain,Transmission (telecommunications),Computer science,Sampling (signal processing),Signal integrity,Electronic engineering,Reflectometry,Time-domain reflectometry,Slew rate,Distortion
Conference
ISSN
Citations 
PageRank 
1081-7735
0
0.34
References 
Authors
0
4
Name
Order
Citations
PageRank
Suvadeep Banerjee1165.21
Hyun Woo Choi2356.71
David C. Keezer36817.00
Abhijit Chatterjee41949269.99