Name
Abstract | ||
|---|---|---|
With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this problem in the future could consist in using fault tolerant architectures ... |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/DFT.2008.45 | DFT |
Keywords | Field | DocType |
possible solution,nano dimension,fault tolerant architecture,nanoscale biosensor,defect tolerance,biosensor,analog circuits,capacitance,lab on a chip,antigen,capacitive sensors,chip,oscillations,fluids,materials,nanoscale,biosensors,fabrication,encapsulation | Oscillation,Analogue electronics,Capacitance,Computer science,Capacitive sensing,Electronic engineering,Biosensor,Electronic circuit,Lab-on-a-chip,Fabrication | Conference |
ISSN | Citations | PageRank |
1550-5774 | 0 | 0.34 |
References | Authors | |
4 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Glenn H. Chapman | 1 | 167 | 34.10 |
| Vijay K. Jain | 2 | 93 | 54.61 |