| Fault Tolerance for Islandable-Microgrid Sensors | 0 | 0.34 | 2021 |
| Dependence of SEUs in Digital Cameras on Pixel size and Elevation | 0 | 0.34 | 2021 |
| Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation | 0 | 0.34 | 2020 |
| Detecting SEUs in Noisy Digital Imagers with small pixels | 1 | 0.37 | 2019 |
| Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels | 2 | 0.45 | 2018 |
| Experimental study and analysis of soft and permanent errors in digital cameras | 0 | 0.34 | 2016 |
| Single Event Upsets and Hot Pixels in digital imagers | 4 | 0.62 | 2015 |
| Improved image accuracy in Hot Pixel degraded digital cameras | 0 | 0.34 | 2013 |
| Relating digital imager defect rates to pixel size, sensor area and ISO | 0 | 0.34 | 2012 |
| Do more camera pixels result in a better picture? | 2 | 0.44 | 2012 |
| Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors | 0 | 0.34 | 2011 |
| Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid | 1 | 0.38 | 2011 |
| Predicting Pixel Defect Rates Based on Image Sensor Parameters | 2 | 0.47 | 2011 |
| Massively Deployable Intelligent Sensors for the Smart Power Grid. | 5 | 0.57 | 2010 |
| Tradeoffs in Imager Design with Respect to Pixel Defect Rates. | 6 | 0.99 | 2010 |
| Characterization of Gain Enhanced In-Field Defects in Digital Imagers | 1 | 0.62 | 2009 |
| Statistical identification and analysis of defect development in digital imagers | 9 | 1.42 | 2009 |
| Automatic Detection Of In-Field Defect Growth In Image Sensors | 0 | 0.34 | 2008 |
| Defect Tolerance for a Capacitance Based Nanoscale Biosensor | 0 | 0.34 | 2008 |
| Quantitative Analysis of In-Field Defects in Image Sensor Arrays | 15 | 2.41 | 2007 |
| A Multiprocessor System-On-Chip Implementation Of A Laser-Based Transparency Meter On An Fpga | 3 | 0.40 | 2007 |
| A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects | 0 | 0.34 | 2007 |
| Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC | 5 | 0.71 | 2006 |
| On-Line Mapping of In-Field Defects in Image Sensor Arrays | 4 | 1.08 | 2006 |
| Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies | 1 | 0.41 | 2006 |
| Inter-plane via defect detection using the sensor plane in 3D heterogeneous sensor systems | 4 | 0.72 | 2005 |
| A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor | 12 | 1.19 | 2005 |
| Noise Analysis of Fault Tolerant Active Pixel Sensors | 0 | 0.34 | 2005 |
| On-line identification of faults in fault-tolerant imagers | 0 | 0.34 | 2005 |
| A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC | 10 | 0.95 | 2005 |
| Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS) | 2 | 0.51 | 2004 |
| A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction | 8 | 1.39 | 2004 |
| Defect Avoidance in a 3-D Heterogeneous Sensor | 9 | 1.13 | 2004 |
| Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS) | 2 | 0.57 | 2003 |
| Level-hybrid optoelectronic TESH interconnection network | 0 | 0.34 | 2003 |
| Design of a self-correcting active pixel sensor | 9 | 1.35 | 2001 |
| Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip | 5 | 0.95 | 2001 |
| A Self-Correcting Active Pixel Camera | 11 | 2.30 | 2000 |
| Creating 35 mm camera active pixel sensors | 9 | 2.25 | 1999 |
| Yield improvement of a large area magnetic field sensor array using redundancy schemes | 0 | 0.34 | 1997 |
| Laser Processes for Defect Correction in Large Area VLSI Systems | 0 | 0.34 | 1994 |
| Wafer-scale transducer arrays | 3 | 0.65 | 1992 |
| A Monolithic Hough Transform Processor Based on Restructurable VLSI | 22 | 3.73 | 1988 |
