Paper Info
Title
A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing
Abstract
Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the quality of previous X-filling methods for reducing launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this quality problem with a novel, GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner, and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss.Evaluation experiments are being conducted on benchmark and industrial circuits, and initial results have demonstrated the usefulness of GA-fill.
Year
DOI
Venue
2009
10.1109/PRDC.2009.21
PRDC
Keywords
Field
DocType
quality problem,integrated circuit testing,launch switching activity,ir-drop-induced yield loss,ga-based method,integrated circuits,ir-drop at-speed scan testing,power-aware x-filling,reduce launch switching activity,low scalability,ga-fill,global-only reduction,reduction effect,previous x-filling method,low effect,at-speed scan testing,genetic algorithm,genetic algorithms,ga,high-quality x-filling,x-filling,cpu time,x-filling method,switches,gallium,scalability,testing,probability
CPU time,Computer science,Real-time computing,Electronic circuit,Integrated circuit,Genetic algorithm,Embedded system,Scalability
Conference
ISBN
Citations 
PageRank 
978-0-7695-3849-5
4
0.43
References 
Authors
22
5
Name
Order
Citations
PageRank
Yuta Yamato11389.45
Xiaoqing Wen279077.12
Kohei Miyase356238.71
Hiroshi Furukawa4223.63
Seiji Kajihara598973.60