Title
High-Throughput Electron Beam Direct Writing Of Via Layers By Character Projection With One-Dimensional Via Characters
Abstract
Character projection (CP) is a high-speed mask-less exposure technique for electron-beam direct writing (EBDW). In CP exposure of VIA layers, higher throughput is realized if more VIAs are exposed in each EB shot, but it will result in huge number of VIA characters to cover arbitrary VIA arrangements. We adopt one-dimensional VIA arrays as the basic CP character architecture to increase VIA numbers in an EB shot while saving the stencil area by superposed character arrangement. In addition, CP throughput is further improved by layout constraints on the VIA placement in the detail routing phase. Our experimental results proved the feasibility of our exposure strategy in the practical CP use in 14 nm lithography.
Year
DOI
Venue
2013
10.1587/transfun.E96.A.2458
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES
Keywords
Field
DocType
electron beam direct writing, character projection, VIA, interconnect, routing
Cathode ray,Direct writing,Theoretical computer science,Computational science,Throughput,Interconnection,Mathematics
Journal
Volume
Issue
ISSN
E96A
12
0916-8508
Citations 
PageRank 
References 
0
0.34
5
Authors
6
Name
Order
Citations
PageRank
Rimon Ikeno183.29
Takashi Maruyama251.20
Satoshi Komatsu300.34
Tetsuya Iizuka49233.22
Makoto Ikeda51202207.10
kunihiro asada627378.26