Paper Info
Title
Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis.
Abstract
This paper proposes new pathological element-based active device models which can be used in analysis tasks of linear(ized) analog circuits. Nullators and norators along with the voltage mirror-current mirror (VM-CM) pair (collectively known as pathological elements) are used to model the behavior of active devices in voltage-, current-, and mixed-mode, also considering parasitic elements. Since analog circuits are transformed to nullor-based equivalent circuits or VM-CM pairs or as a combination of both, standard nodal analysis can be used to formulate the admittance matrix. We present a formulation method in order to build the nodal admittance (NA) matrix of nullor-equivalent circuits, where the order of the matrix is given by the number of nodes minus the number of nullors. Since pathological elements are used to model the behavior of active devices, we introduce a more efficient formulation method in order to compute small-signal characteristics of pathological element-based equivalent circuits, where the order of the NA matrix is given by the number of nodes minus the number of pathological elements. Examples are discussed in order to illustrate the potential of the proposed pathological element-based active device models and the new formulation method in performing symbolic analysis of analog circuits. The improved formulation method is compared with traditional formulation methods, showing that the NA matrix is more compact and the generation of nonzero coefficients is reduced. As a consequence, the proposed formulation method is the most efficient one reported so far, since the CPU time and memory consumption is reduced when recursive determinant-expansion techniques are used to solve the NA matrix.
Year
DOI
Venue
2011
10.1109/TCSI.2010.2097696
IEEE Trans. on Circuits and Systems
Keywords
Field
DocType
active networks,analogue circuits,current mirrors,equivalent circuits,linearisation techniques,matrix algebra,operational amplifiers,CPU time,NA matrix,VM-CM pair,active devices,formulation method,linearized analog circuits,memory consumption,nodal admittance matrix,nonzero coefficients,norators,nullators,nullor-based equivalent circuits,nullor-equivalent circuits,pathological element-based active device models,pathological element-based equivalent circuits,pathological elements,recursive determinant-expansion techniques,small-signal characteristics,standard nodal analysis,symbolic analysis,voltage mirror-current mirror pair,Current conveyors,nullor,operational amplifiers,pathological elements,symbolic nodal analysis
Nullor,Current mirror,Nodal analysis,Control theory,Matrix (mathematics),Electronic engineering,Symbolic data analysis,Admittance parameters,Nodal admittance matrix,Mathematics,Equivalent circuit
Journal
Volume
Issue
ISSN
58-I
6
1549-8328
Citations 
PageRank 
References 
35
2.26
18
Authors
4
Name
Order
Citations
PageRank
Carlos Sánchez-López1393.21
Francisco V. Fernández223440.82
Esteban Tlelo-Cuautle312728.92
Sheldon X. -D. Tan482993.06