Application of Scan-Based DFT Methodology for Detecting Static and Timing Failures in VLSI Components - Citegraph

Paper Info

Title
Application of Scan-Based DFT Methodology for Detecting Static and Timing Failures in VLSI Components

Year	Venue	Field
1991	VLSI	Computer science,Electronic engineering,Computer hardware,Very-large-scale integration
DocType	Citations	PageRank
Conference	0	0.34
References	Authors
0	2

Authors (2 rows)

Cited by (0 rows)

References (0 rows)

Name	Order	Citations	PageRank
Bulent I. Dervisoglu	1	116	10.56
Gayvin E. Stong	2	105	7.34

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