Author Info
Name
Papers
Collaborators
GAYVIN E. STONG
2
1
Citations 
PageRank 
Referers 
105
7.34
200
Referees 
References 
5
3
Search Limit
100200
Title
Citations
PageRank
Year
Design for Testability: Using Scanpath Techniques for Path-Delay Test and Measurement1057.001991
Application of Scan-Based DFT Methodology for Detecting Static and Timing Failures in VLSI Components00.341991