Name
Abstract | ||
|---|---|---|
Discussed is a circuit which measures and analyses powersupply transients as defined in the test technique, TransientSignal Analysis (TSA). This circuit can replace the bench-topinstrumentation and offline signal processing softwareused in previous work. The circuit accepts voltage transientsas analog inputs from the Device-Under-Test (DUT),performs integration and outputs an analog value to thetester. The tester compares the output value to a predeterminedthreshold as a means of determining the pass/failstatus of the DUT. This circuit is designed to simplify thehardware requirements of TSA. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/TEST.2001.966691 | ITC |
Keywords | Field | DocType |
circuit simulation,digital integrated circuits,integrated circuit testing,integrating circuits,transient analysis,DUT,Spice simulations,analog inputs,analog value,digital integrated circuit testing,hardware requirements simplification,pass/fail status,power supply transient signal integration circuit,power supply transients measurement,predetermined threshold,test technique,transient signal analysis,voltage transients | Discrete circuit,Computer science,Circuit extraction,Circuit design,Electronic engineering,Mixed-signal integrated circuit,Electronic circuit simulation,Electrical engineering,Linear circuit,Asynchronous circuit,Equivalent circuit | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7169-0 | 2 |
PageRank | References | Authors |
0.45 | 10 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chintan Patel | 1 | 385 | 37.44 |
| Fidel Muradali | 2 | 62 | 10.25 |
| James F. Plusquellic | 3 | 109 | 15.02 |