Name
Abstract | ||
|---|---|---|
Advances in semiconductor design and manufacturing technology enable the design of complete systems on one IC. To develop these system ICs in a timely manner, traditional IC design in which everything is designed from scratch, is replaced by a design style based on embedding large reusable modules, the so-called cores. Effectively, the design of a core-based IC is partitioned over the core provider(s) and the system-chip integrator. The development of tests should follow the same partitioning. We describe the differences between traditional and core-based test development, and present an overview of current industrial approaches. We list the future challenges regarding standardization, tool development, and academic and industrial research |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/35.769283 | IEEE Communications Magazine |
Keywords | Field | DocType |
core-based test development,tool development,core-based ic,semiconductor design,current industrial approach,core-based system ics,traditional ic design,industrial research,complete system,core provider,design style,standardisation,manufacturing,academic research,printed circuits,chip,hardware,standardization,system testing | Design for testing,Systems engineering,Computer science,Integrator,Circuit design,Integrated circuit design,Mixed-signal integrated circuit,Physical design,Integrated circuit development,Standardization,Distributed computing | Journal |
Volume | Issue | ISSN |
37 | 6 | 0163-6804 |
Citations | PageRank | References |
31 | 4.86 | 6 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| E. J. Marinissen | 1 | 60 | 8.57 |
| Y. Zorian | 2 | 499 | 47.97 |