Name
Abstract | ||
|---|---|---|
A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters are analyzed, and a single sine-wave histogram test can be performed to evaluate the ADC. With the appropriate approximations in the reference sine-wave histograms and the estimations of the ADC parameters, the realization of an ADC output analyzer circuit could be a simple task. An ADC output analyzer circuit is therefore developed and synthesized using a 0.18-mum technique to analyze the outputs of an 8-bit ADC and estimate its performances using the proposed method. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/TIM.2007.910106 | IEEE T. Instrumentation and Measurement |
Keywords | Field | DocType |
sine-wave histogram test,offset error,gain error,nonlinearity errors,nonlinearity error,analogue-digital conversion,parameter estimation,sine-wave histogram-testing structure,analog-to-digital converters,degraded signal-to-noise ratio (snr) value,analog-to-digital converters (adcs),size 0.18 mum,adc output analyzer circuit,a/d converter,static parameters,circuit testing,signal-to-noise ratio,signal to noise ratio,test methods | Flight dynamics (spacecraft),Histogram,Computer science,Signal-to-noise ratio,Electronic engineering,Effective number of bits,Estimation theory,Successive approximation ADC,Spectrum analyzer,Offset (computer science) | Journal |
Volume | Issue | ISSN |
57 | 2 | 0018-9456 |
Citations | PageRank | References |
16 | 1.05 | 8 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hsin-Wen Ting | 1 | 41 | 8.81 |
| Bin-da Liu | 2 | 563 | 66.56 |
| Soon-Jyh Chang | 3 | 655 | 73.67 |