Name
Affiliation
Papers
HSIN-WEN TING
Department of Electronics Engineering, National Kaohsiung University of Applied Sciences, Kaohsiung, Taiwan
20
Collaborators
Citations 
PageRank 
26
41
8.81
Referers 
Referees 
References 
101
413
185
Search Limit
100413
Title
Citations
PageRank
Year
A Fast and Jitter-Modulation Free Jitter Tolerance Estimation Technique for Bang- Bang CDRs.00.342018
A VLSI On-Chip Analog High-Order Low-Pass Filter Performance Evaluation Strategy.00.342018
Multi-Channel Multi-Gigabit Prbs Generator With A Built-In Clock In 0.18-Mu M Cmos Technology00.342017
Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing.00.342017
Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs.10.362016
A Digital Testing Strategy for Characterizing an Analog Circuit Block.00.342016
A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS.00.342015
A Low-Cost Stimulus Design For Linearity Test In Sar Adcs00.342014
Digital-Compatible Testing Scheme for Operational Amplifier00.342012
Six-bit 2.7-GS/s 5.4-mW Nyquist complementary metal-oxide semiconductor digital-to-analogue converter for ultra-wideband transceivers.10.652012
A Third-Order Low-Distortion Delta-Sigma Modulator With Opamp Sharing And Relaxed Feedback Path Timing10.392012
Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs.10.362011
Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction90.702011
An Output Response Analyzer Circuit for ADC Built-in Self-Test00.342011
Realization of High Octave Decomposition for Breast Cancer Feature Extraction on Ultrasound Images.30.392011
A Design of Linearity Built-in Self-Test for Current-Steering DAC40.702011
A Histogram-Based Testing Method for Estimating A/D Converter Performance161.052008
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST20.392007
A Cam/Wta-Based High Speed And Low Power Longest Prefix Matching Circuit Design20.392006
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters10.392004