Name
Title | ||
|---|---|---|
Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction |
Abstract | ||
|---|---|---|
A transition-code based method is proposed to reduce the linearity testing time of pipelined analog-to-digital converters (ADCs). By employing specific architecture-dependent rules, only a few specific transition codes need to be measured to accomplish the accurate linearity test of a pipelined ADC. In addition, a simple digital Design-for-Test (DfT) circuit is proposed to help correctly detect transition codes corresponding to each pipelined stage. With the help of the DfT circuit, the proposed method can be applied for pipelined ADCs with digital error correction (DEC). Experimental results of a practical chip show that the proposed method can achieve high test accuracy for a 12-bit 1.5-bit/stage pipelined ADC with different nonlinearities by measuring only 9.3% of the total measured samples of the conventional histogram based method. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TVLSI.2010.2089543 | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Keywords | Field | DocType |
pipelined stage,linearity test method,integrated circuit testing,digital design-for-test circuit,pipelined,analogue-digital conversion,digital error correction,pipelined analog-to-digital converters,linearity testing time,dft circuit,pipelined adc,digital circuits,static linearity test,histogram,error correction codes,differential nonlinearity (dnl),pipeline arithmetic,analog-to-digital converter (adc),pipelined analog-to-digital converter,transition code,design-for-test (dft),specific transition codes,integral nonlinearity (inl),design for testability,pipelined adcs,high test accuracy,accurate linearity test,digital design,design for test,test methods,error correction,indexing terms,linearity,chip,capacitors | Flight dynamics (spacecraft),Design for testing,Histogram,Test method,Digital electronics,Computer science,Linearity,Real-time computing,Chip,Error detection and correction,Electronic engineering | Journal |
Volume | Issue | ISSN |
19 | 12 | 1063-8210 |
Citations | PageRank | References |
9 | 0.70 | 11 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jin-fu Lin | 1 | 37 | 4.79 |
| Soon-Jyh Chang | 2 | 655 | 73.67 |
| Te-Chieh Kung | 3 | 17 | 1.46 |
| Hsin-Wen Ting | 4 | 41 | 8.81 |
| Chih-Hao Huang | 5 | 182 | 25.75 |