Name
Abstract | ||
|---|---|---|
This paper describes a novel test methodology for testing MEMS magnetic micromotor. A fault simulation model has been developed for the micromotor. The test apparatus consists of a low frequency sinusoidal source and a resonator that is tuned to the normal operating frequency of the micromotor. The test method described in this paper is used to detect complete open and near-open defects in the stator coils of the micromotor. |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/VTEST.1999.766677 | VTS |
Keywords | Field | DocType |
mems magnetic micromotors,normal operating frequency,novel test methodology,mems magnetic micromotor,test method,fault simulation model,low frequency sinusoidal source,test apparatus,near-open defect,stator coil,test methods,resonator,si,low frequency,normal operator,test methodology,silicon,conductors,micromagnetics,magnetic flux,testing | Test method,Low frequency,Microelectromechanical systems,Computer science,Resonator,Electrical conductor,Electronic engineering,Stator,Magnetic flux,Micromagnetics | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-0146-X | 1 |
PageRank | References | Authors |
0.36 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bruce C. Kim | 1 | 89 | 21.11 |
| Krishna Marella | 2 | 1 | 0.36 |