Name
Title | ||
|---|---|---|
I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment |
Abstract | ||
|---|---|---|
An I_DDQ test method is proposed in this paper, which is applicable even if supply current measurement is impaired by noise. Wavelet transformation is used for noise elimination in the test method. In this paper, it is shown by some experiments that bridging faults will be detected by using the proposed test method. Since expert knowledge on filter design is not needed in noise elimination of the I_DDQ test method, it is expected that the test method will be used in many I_DDQ tests. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/ATS.2004.50 | Asian Test Symposium |
Keywords | Field | DocType |
filter design,I_DDQ test method,test method,I_DDQ test,wavelet transformation,Wavelet Transformation,supply current measurement,noise elimination,I_DDQ Test Method,proposed test method,Noisy Current Measurement Environment,expert knowledge | Test method,Leakage (electronics),Computer science,Bridging (networking),Algorithm,CMOS,Electronic engineering,Noise elimination,Wavelet,Wavelet transform,Filter design | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-2235-1 | 0 |
PageRank | References | Authors |
0.34 | 10 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masaki Hashizume | 1 | 98 | 27.83 |
| Daisuke Yoneda | 2 | 0 | 0.34 |
| Hiroyuki Yotsuyanagi | 3 | 70 | 19.04 |
| Tetsuo Tada | 4 | 19 | 3.89 |
| Takeshi Koyama | 5 | 0 | 1.01 |
| Ikuro Morita | 6 | 0 | 0.34 |
| Takeomi Tamesada | 7 | 45 | 12.49 |