Name
Abstract | ||
|---|---|---|
This paper presents a new RF built-in self-test (BIST) measurement and a new automatic-performance-compensation network for a system-on-chip (SoC) transceiver. We built a 5-GHz low noise amplifier (LNA) with an on-chip BIST circuit using 0.18-μm SiGe technology. The BIST-measurement circuit contains a test amplifier and RF peak detectors. The complete measurement setup contains an LNA with a BIST circuit, an external RF source, RF relays, 50-Ω load impedance, and a dc voltmeter. The proposed BIST circuit measures input impedance, gain, noise figure, input return loss, and output signal-to-noise ratio of the LNA. The test technique utilizes the output dc-voltage measurements, and these measured values are translated to the LNA specifications such as the gain through the developed equations. The performance of the LNA was improved by using the new automatic compensation network (ACN) that adjusts the performance of the LNA with the processor in the SoC transceiver. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/TIM.2006.870317 | IEEE T. Instrumentation and Measurement |
Keywords | Field | DocType |
system-on-chip (soc),test amplifier,transceivers,5 ghz,automatic compensation network (acn),noise figure measurement,integrated circuit testing,output dc-voltage measurements,input impedance measurement,sige,low noise amplifiers,gain measurement,system-on-chip transceivers,50 ohm,telecommunication equipment testing,output signal-to-noise ratio,input return loss measurement,low noise amplifier,system-on-chip,rf built-in self-test measurement,built-in self test,on-chip bist circuit,integrated circuit measurement,low noise amplifier (lna),ge-si alloys,dc voltmeter,automatic performance compensation network,mmic amplifiers,0.18 micron,rf peak detectors,built-in self-test (bist),impedance measurement,radio frequency,chip,system on a chip,system on chip,noise figure,signal to noise ratio | Low-noise amplifier,System on a chip,Return loss,Transceiver,Noise figure,Electronic engineering,Input impedance,Electrical engineering,Mathematics,Amplifier,Built-in self-test | Journal |
Volume | Issue | ISSN |
55 | 2 | 0018-9456 |
Citations | PageRank | References |
15 | 1.17 | 5 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jee-Youl Ryu | 1 | 33 | 6.13 |
| Bruce C. Kim | 2 | 89 | 21.11 |
| Iboun Taimiya Sylla | 3 | 22 | 3.15 |