Paper Info
Title
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field
Abstract
In this paper, test input vectors for a supply current test method are discussed which is used for detecting open defects in CMOS ICs. In the test method, time-variable electric field is applied from the outside of ICs so as to vary the voltage at a floating node. To generate excessive supply current by the induced voltage change at the floating node, test pattern must be provided so that a conducting path from VDD to GND can be generated in the faulty circuit. In this paper, the requirements are denoted to be satisfied as a test input vector of the test method. Also, it is shown that test pattern of functional tests based on stuck-at fault models can be used for the open defect detection method. Furthermore, the experimental results in this paper promise us that high fault coverage can be achieved by applying the subset of the stuck-at test pattern to the detection of open defects.
Year
DOI
Venue
2001
10.1109/DFTVS.2001.966781
DFT
Keywords
Field
DocType
supply current test method,test pattern,time-variable electric field,test method,supply current test,test input vector,paper promise,floating node,stuck-at test pattern,open defect,functional test,open defect detection method,open defects,automatic test pattern generation,test methods,fault detection,functional tests,read only memory,fault model,electric field,functional testing,satisfiability,fault coverage
Test method,Automatic test pattern generation,Electric field,Fault coverage,Computer science,Voltage,Electronic engineering,CMOS,Test compression,Supply current
Conference
ISSN
ISBN
Citations 
1550-5774
0-7695-1203-8
2
PageRank 
References 
Authors
0.56
6
5
Name
Order
Citations
PageRank
Hiroyuki Yotsuyanagi17019.04
Masaki Hashizume29827.83
Taisuke Iwakiri320.89
Masahiro Ichimiya442.36
Takeomi Tamesada54512.49