Name
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/VTEST.1993.313365 | VTS |
Keywords | Field | DocType |
fault detection,sequential analysis,sequential circuits,controllability,system testing | Partial scan,Generation time,Sequential logic,Computer science,Fault detection and isolation,System testing,Test sequence,Electronic engineering,Real-time computing,System time,Electronic circuit | Conference |
Citations | PageRank | References |
0 | 0.34 | 3 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Vishwani D. Agrawal | 1 | 3502 | 470.06 |
| Tapan J. Chakraborty | 2 | 258 | 26.11 |