Name
Title | ||
|---|---|---|
A Capture-Safety Checking Metric Based On Transition-Time-Relation For At-Speed Scan Testing |
Abstract | ||
|---|---|---|
Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1587/transinf.E96.D.2003 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
at-speed testing, ATPG, IR-drop, test power reduction, low power test | Automatic test pattern generation,Computer vision,Power network design,Computer science,Real-time computing,Transition time,Artificial intelligence | Journal |
Volume | Issue | ISSN |
E96D | 9 | 1745-1361 |
Citations | PageRank | References |
1 | 0.37 | 13 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kohei Miyase | 1 | 562 | 38.71 |
| Ryota Sakai | 2 | 1 | 0.37 |
| Xiaoqing Wen | 3 | 790 | 77.12 |
| Masao Aso | 4 | 2 | 0.72 |
| Hiroshi Furukawa | 5 | 22 | 3.63 |
| Yuta Yamato | 6 | 138 | 9.45 |
| Seiji Kajihara | 7 | 989 | 73.60 |