Name
Title | ||
|---|---|---|
A sequential circuit structure with combinational test generation complexity and its application |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1002/(SICI)1520-684X(199710)28:11<11::AID-SCJ2>3.0.CO;2-N | Systems and Computers in Japan |
Keywords | Field | DocType |
test,sequential circuits,integrated circuit,system performance,sequential circuit,finite automaton,algorithm,computational complexity | Generation time,Computer science,Combinational logic,Artificial intelligence,Integrated circuit,Testability,Automatic test pattern generation,Topology,Sequential logic,Algorithm,Finite-state machine,Machine learning,Computational complexity theory | Journal |
Volume | Issue | Citations |
28 | 11 | 5 |
PageRank | References | Authors |
0.62 | 3 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hideo Fujiwara | 1 | 184 | 20.31 |
| Satoshi Ohtake | 2 | 135 | 21.62 |
| Tomoya Takasaki | 3 | 20 | 2.25 |