Name
Title | ||
|---|---|---|
Study of performance degradations in DC-DC converter due to hot carrier stress by simulation |
Abstract | ||
|---|---|---|
The hot carrier effects on the 0.25 μm high voltage LDMOS has been examined by the accelerated stress experiment. Although the model parameters changed slightly, the switching performances degraded significantly, which have been simulated with the compact models extracted from the test devices by ICCAP. A full bridge DC-DC converter with the compact models was proposed in Cadence SpectreRF. The simulated results show that the efficiency of the full bridge DC-DC converter degraded significantly due to the hot carrier effects. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1016/j.microrel.2006.07.079 | Microelectronics Reliability |
Keywords | Field | DocType |
high voltage | Cadence,LDMOS,Electronic engineering,Engineering,High voltage,Dc dc converter,Electrical engineering,Lateral diffusion,Commutation,Hot carrier stress | Journal |
Volume | Issue | ISSN |
46 | 9 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chongxiu Yu | 1 | 3 | 4.58 |
| Jian Liu | 2 | 289 | 59.26 |
| J.S. Yuan | 3 | 1 | 1.38 |