Name
Title | ||
|---|---|---|
Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms |
Abstract | ||
|---|---|---|
In this paper, recent advances of a new digital-signal-processor (DSP)-based impedance measurement instrument under development are presented. The digital signal processing algorithms are based on ellipse fitting for the extraction of the acquired sine signal parameters. so that the impedance magnitude and phase can be determined. Special attention is devoted to the improvement of the algorithm's ... |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/TIM.2009.2014512 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Impedance measurement,Signal processing algorithms,Instruments,Digital signal processing,Data mining,Signal processing,Parameter estimation,Measurement uncertainty,Frequency measurement,Particle measurements | Signal processing,Digital signal processing,Curve fitting,Computer science,Digital signal processor,Algorithm,Measurement uncertainty,Electrical impedance,Electronic engineering,Estimation theory,Sweep frequency response analysis | Journal |
Volume | Issue | ISSN |
58 | 5 | 0018-9456 |
Citations | PageRank | References |
6 | 0.79 | 8 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pedro M. Ramos | 1 | 115 | 17.91 |
| Fernando M. Janeiro | 2 | 47 | 6.74 |
| Mouhaydine Tlemçani | 3 | 6 | 1.12 |
| A. Cruz Serra | 4 | 123 | 20.70 |